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Achieving high-speed, high-precision measurements of microdomains, curved surfaces, and ultra-thin samples at an unprecedented low cost.
●Price: 4,000,000 yen (excluding tax) ●If you would like a demonstration, please contact us.
Measuring reflectance that causes strong reflected light and ghost flares! It is also possible for uneven black parts.
We would like to introduce a case study of "reflectance measurement" conducted by our company. High reflectance on the surface of components often leads to harmful ghosts, and examining the reflectance of the measurement surface can be helpful for improving coatings and surface treatments. It is possible to measure transparent items like lenses with anti-reflective coatings, as well as black components with irregularities. We also welcome inquiries regarding specified samples and measurement locations. 【Case Overview】 ■Measurement Item: Reflectance between wavelengths of 380 to 780 nm ■Measuring Instrument: Microspectrophotometer "Olympus USPM-RU" *For more details, please refer to the PDF document or feel free to contact us.
Achieved at an unprecedented low cost.
- By adopting a special half-mirror (patented), it cuts off back surface reflection light, allowing for accurate measurements in a short time without any back surface treatment. (Measurement of reflectance for a thin plate of 0.2mm is possible: using a ×20 objective lens) - It is also possible to measure lens curvature and coating unevenness. (Connecting micro spots (φ50μm) on the sample surface) - High reproducibility measurements can be achieved in a short time even for low-reflectance samples. (Thanks to a unique optical design that maximizes light intake, it features a 512-element linear PDA, a built-in 16-bit A/D converter, and a USB2.0 interface for fast calculations) - Colorimetric measurements and L*a*b* measurements are possible. Object measurements can be performed based on spectral reflectance using spectrophotometry. - Data can be saved in Microsoft Excel(R) format. - Single-layer films can be measured non-contact and non-destructively. - It has a function to display multiple measurement results on the same screen, making it easy to compare results.
Reflectance measurement device
This is a spectrophotometer that allows for easy measurement of reflectance. It is an integrated unit with a spectrometer, light source, and fiber, enabling simple and instantaneous measurements without the need for complicated settings or optical axis adjustments. With a light source and CCD/InGaAs detector, it enables high-sensitivity and high-speed measurements of 20 to 100 spectra per second over the range of 250nm to 1700nm.
