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Achieving high-speed, high-precision measurements of microdomains, curved surfaces, and ultra-thin samples at an unprecedented low cost.
●Price: 4,000,000 yen (excluding tax) ●If you would like a demonstration, please contact us.
Achieved at an unprecedented low cost.
- By adopting a special half-mirror (patented), it cuts off back surface reflection light, allowing for accurate measurements in a short time without any back surface treatment. (Measurement of reflectance for a thin plate of 0.2mm is possible: using a ×20 objective lens) - It is also possible to measure lens curvature and coating unevenness. (Connecting micro spots (φ50μm) on the sample surface) - High reproducibility measurements can be achieved in a short time even for low-reflectance samples. (Thanks to a unique optical design that maximizes light intake, it features a 512-element linear PDA, a built-in 16-bit A/D converter, and a USB2.0 interface for fast calculations) - Colorimetric measurements and L*a*b* measurements are possible. Object measurements can be performed based on spectral reflectance using spectrophotometry. - Data can be saved in Microsoft Excel(R) format. - Single-layer films can be measured non-contact and non-destructively. - It has a function to display multiple measurement results on the same screen, making it easy to compare results.
Reflectance measurement device
This is a spectrophotometer that allows for easy measurement of reflectance. It is an integrated unit with a spectrometer, light source, and fiber, enabling simple and instantaneous measurements without the need for complicated settings or optical axis adjustments. With a light source and CCD/InGaAs detector, it enables high-sensitivity and high-speed measurements of 20 to 100 spectra per second over the range of 250nm to 1700nm.
